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Providing access to elemental insights
Positron probing
Our offer
access to research infrastructure
unprecedented material characterization
as a service
Your Benefit
speeding up
technology innovation
via smart materials with superior properties
saving time
and costs
by shortening R&D cycles
staying ahead of
your competitors
with support from high-class scientific analysis tools
Performance features
Polymers
Quantitative measurements of pore sizes with sub-nm resolution
Measurement of pore / void concentrations
Semiconductors
Characterization of atomistic defect types such as vacancies, vacancy cluster, dislocation and other structural defects …
Quantitative measurement of atomistic defect concentration with high sensitivity < ppm level
Highlights of the method
Non-destructive analysis method
Direct measurement: No tracers molecules necessary
Measurement of closed pores / buried pores
Depth profiles of defects and pores
Sample temperature variable from -190°C - +300°C
Measurement of ultra-thin films (10 nm to 5 µm)
and
measurement of bulk material (up to 3 mm)
We are providing
a full service approach
Evaluating your R&D challenge
Discussing best solution
Measuring your samples
Analyzing data
Reportine results
Our expertise
We work in cooperation with our academic partner
Prof. Dr. Günther Dollinger (Universität der Bundeswehr München) and his working group
20+ years scientific expertise
100+ scientific publications since 2008
20+ scientific cooperation partners
We are bridging the gap between Industry and publicly owned research infrastructure